A63.7081 Schottky Field watsi Gun Gun Binciken Scan Electron Microscope Pro FEG SEM, 15x ~ 800000x
Bayanin samfur
A63.7081 Schottky Gun Fitar Man Fetur Maimaita madubin lantarki Pro FEG SEM | ||
Yanke shawara | 1nm @ 30KV (SE); 3nm @ 1KV (SE); 2.5nm@30KV (BSE) | |
Girma | 15x ~ 800000x | |
Bindigar lantarki | Schottky Emission Gun Gun | |
Electron Beam Yanzu | 10pA ~ 0.3μA | |
Hanzarin Sauti | 0 ~ 30KV | |
Vacuum System | 2 ion Pon, Turbo Molecular Molek, Pampogin Mechanical | |
Ganowa | SE: Mai Gano Electron Secondary na Vacuum (Tare da Kariyar Gano) | |
BSE: Mai Gano Maɓallin Semiconductor Na Farko | ||
CCD | ||
Mataki Sashi | Mataki biyar Axes Eucentric Matattarar Mataki | |
Tafiya Range | X | 0 ~ 150mm |
Y | 0 ~ 150mm | |
Z | 0 ~ 60mm | |
R | 360º | |
T | -5º ~ 75º | |
Max samfurin diamita | 320mm | |
Gyarawa | EBL; STM; AFM; Stage Heating; Cryo Stage; Stsile Stage; Micro-nano Manipulator; SEM + Shafin Inji; SEM + Laser da dai sauransu. | |
Na'urorin haɗi | X-Ray Gano (EDS), EBSD, CL, WDS, Injin Shafa da sauransu. |
Amfani da Lokuta
Binciken sikanin lantarki (sem) ya dace da kallon yanayin saman kasa na karafa, tukwane, masu karantarwa, ma'adanai, ilmin halitta, polymer, hade-hade da sikelin daya-girma, abu biyu da kuma abubuwa uku-uku (hoton lantarki na biyu, Ana iya amfani dashi don nazarin ma'anar, layi da abubuwan da ke cikin microregion.Yana amfani dashi a cikin man fetur, geology, filin ma'adinai, lantarki, filin semiconductor, magani, fannin ilimin halittu, masana'antar sinadarai, filin kayan polymer, binciken laifuka na tsaro na jama'a, aikin gona, gandun daji da sauran fannoni. |
Bayanin Kamfanin
Rubuta sakon ka anan ka turo mana